X-ray topography of subsurface crystal layers1 #MMPMID28656038
Swiatek Z; Fodchuk I; Zaplitnyy R
J Appl Crystallogr 2017[Jun]; 50 (Pt 3): 727-33 PMID28656038show ga
The practical application of the modified Berg?Barrett topographic method in a skew asymmetric scheme of X-ray diffraction is presented. The method is used for the study of the defect structure of CdTe crystals and Cd1?xHgxTe/CdTe epitaxial layers after the influence of different external factors (ion implantation and etching).