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10.3762/bjnano.6.175 http://scihub22266oqcxt.onion/10.3762/bjnano.6.175 C4578422!4578422!26425423     free     free     free Deprecated: Implicit conversion from float 211.6 to int loses precision in C:\Inetpub\vhosts\kidney.de\httpdocs\pget.php on line 534       Beilstein+J+Nanotechnol 2015 ; 6 (ä): 1712-20 Nephropedia Template TP {{tp|p=26425423|t=2015. Imaging of carbon nanomembranes with helium ion microscopy |pdf=|usr=}}{{26425423}} gab.com Text Imaging of carbon nanomembranes with helium ion microscopy JO: Beilstein J Nanotechnol http://www.kidney.de/pget.php?&tw=1&pmid=26425423 #FOAvip Carbon nanomembranes (CNMs) prepared from aromatic self-assembled monolayers constitute a recently developed class of 2D materials. They are made by a combination of self-assembly, radiation-induced cross-linking and the detachment of the cross-linked SAM from its substrate. CNMs can be deposited on arbitrary substrates, including holey and perforated ones, as well as on metallic (transmission electron microscopy) grids. Therewith, freestanding membranes with a thickness of 1 nm and macroscopic lateral dimensions can be prepared. Although free-standing CNMs cannot be imaged by light microscopy, charged particle techniques can visualize them. However, CNMs are electrically insulating, which makes them sensitive to charging. We demonstrate that the helium ion microscope (HIM) is a good candidate for imaging freestanding CNMs due to its efficient charge compensation tool. Scanning with a beam of helium ions while recording the emitted secondary electrons generates the HIM images. The advantages of HIM are high resolution, high surface sensitivity and large depth of field. The effects of sample charging, imaging of multilayer CNMs as well as imaging artefacts are discussed. Twit Text FOAVip Imaging of carbon nanomembranes with helium ion microscopy ????Beilstein J Nanotechnol http://www.kidney.de/pget.php?&tw=1&pmid=26425423 #FOAvip Twit Text # Free Paper on # # # # # LINK http://www.kidney.de/pget.php?&tw=1&pmid=26425423 #FOAvip English Wikipedia <ref>{{Cite pmid|26425423}}</ref> Imaging of carbon nanomembranes with helium ion microscopy #MMPMID26425423 Beyer A; Vieker H; Klett R; Meyer zu Theenhausen H; Angelova P; Gölzhäuser A Beilstein J Nanotechnol 2015[]; 6 (ä): 1712-20 PMID26425423show ga Carbon nanomembranes (CNMs) prepared from aromatic self-assembled monolayers constitute a recently developed class of 2D materials. They are made by a combination of self-assembly, radiation-induced cross-linking and the detachment of the cross-linked SAM from its substrate. CNMs can be deposited on arbitrary substrates, including holey and perforated ones, as well as on metallic (transmission electron microscopy) grids. Therewith, freestanding membranes with a thickness of 1 nm and macroscopic lateral dimensions can be prepared. Although free-standing CNMs cannot be imaged by light microscopy, charged particle techniques can visualize them. However, CNMs are electrically insulating, which makes them sensitive to charging. We demonstrate that the helium ion microscope (HIM) is a good candidate for imaging freestanding CNMs due to its efficient charge compensation tool. Scanning with a beam of helium ions while recording the emitted secondary electrons generates the HIM images. The advantages of HIM are high resolution, high surface sensitivity and large depth of field. The effects of sample charging, imaging of multilayer CNMs as well as imaging artefacts are discussed. äImaging of carbon nanomembranes with helium ion microscopy (epmc).pdf DeepDyve Pubget Overpricing