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10.1107/S2052252516001238 http://scihub22266oqcxt.onion/10.1107/S2052252516001238 C4775161!4775161 !27006776     free     free     free Deprecated: Implicit conversion from float 209.6 to int loses precision in C:\Inetpub\vhosts\kidney.de\httpdocs\pget.php on line 534 Deprecated: Implicit conversion from float 209.6 to int loses precision in C:\Inetpub\vhosts\kidney.de\httpdocs\pget.php on line 534 Warning: imagejpeg(C:\Inetpub\vhosts\kidney.de\httpdocs\phplern\27006776 .jpg): Failed to open stream: No such file or directory in C:\Inetpub\vhosts\kidney.de\httpdocs\pget.php on line 117       IUCrJ 2016 ; 3 (Pt 2 ): 127-38 Nephropedia Template TP {{tp|p=27006776 |t=2016. Whole-pattern fitting technique in serial femtosecond nanocrystallography |pdf=|usr=}}{{27006776 }} gab.com Text Whole-pattern fitting technique in serial femtosecond nanocrystallography JO: IUCrJ http://www.kidney.de/pget.php?&tw=1&pmid=27006776 #FOAvip Serial femtosecond X-ray crystallography (SFX) has created new opportunities in the field of structural analysis of protein nanocrystals. The intensity and timescale characteristics of the X-ray free-electron laser sources used in SFX experiments necessitate the analysis of a large collection of individual crystals of variable shape and quality to ultimately solve a single, average crystal structure. Ensembles of crystals are commonly encountered in powder diffraction, but serial crystallography is different because each crystal is measured individually and can be oriented via indexing and merged into a three-dimensional data set, as is done for conventional crystallography data. In this way, serial femtosecond crystallography data lie in between conventional crystallography data and powder diffraction data, sharing features of both. The extremely small sizes of nanocrystals, as well as the possible imperfections of their crystallite structure, significantly affect the diffraction pattern and raise the question of how best to extract accurate structure-factor moduli from serial crystallography data. Here it is demonstrated that whole-pattern fitting techniques established for one-dimensional powder diffraction analysis can be feasibly extended to higher dimensions for the analysis of merged SFX diffraction data. It is shown that for very small crystals, whole-pattern fitting methods are more accurate than Monte Carlo integration methods that are currently used. Twit Text FOAVip Whole-pattern fitting technique in serial femtosecond nanocrystallography ????IUCrJ http://www.kidney.de/pget.php?&tw=1&pmid=27006776 #FOAvip Twit Text # Free Paper on # # # # # LINK http://www.kidney.de/pget.php?&tw=1&pmid=27006776 #FOAvip English Wikipedia <ref>{{Cite pmid|27006776 }}</ref> Whole-pattern fitting technique in serial femtosecond nanocrystallography #MMPMID27006776 Dilanian RA ; Williams SR ; Martin AV ; Streltsov VA ; Quiney HM IUCrJ 2016[Mar]; 3 (Pt 2 ): 127-38 PMID27006776 show ga Serial femtosecond X-ray crystallography (SFX) has created new opportunities in the field of structural analysis of protein nanocrystals. The intensity and timescale characteristics of the X-ray free-electron laser sources used in SFX experiments necessitate the analysis of a large collection of individual crystals of variable shape and quality to ultimately solve a single, average crystal structure. Ensembles of crystals are commonly encountered in powder diffraction, but serial crystallography is different because each crystal is measured individually and can be oriented via indexing and merged into a three-dimensional data set, as is done for conventional crystallography data. In this way, serial femtosecond crystallography data lie in between conventional crystallography data and powder diffraction data, sharing features of both. The extremely small sizes of nanocrystals, as well as the possible imperfections of their crystallite structure, significantly affect the diffraction pattern and raise the question of how best to extract accurate structure-factor moduli from serial crystallography data. Here it is demonstrated that whole-pattern fitting techniques established for one-dimensional powder diffraction analysis can be feasibly extended to higher dimensions for the analysis of merged SFX diffraction data. It is shown that for very small crystals, whole-pattern fitting methods are more accurate than Monte Carlo integration methods that are currently used. äWhole-pattern fitting technique in serial femtosecond nanocrystallogra(epmc).pdf DeepDyve Pubget Overpricing