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2015 ; 2
(Pt 6
): 627-34
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Towards phasing using high X-ray intensity
#MMPMID26594370
Galli L
; Son SK
; Barends TR
; White TA
; Barty A
; Botha S
; Boutet S
; Caleman C
; Doak RB
; Nanao MH
; Nass K
; Shoeman RL
; Timneanu N
; Santra R
; Schlichting I
; Chapman HN
IUCrJ
2015[Nov]; 2
(Pt 6
): 627-34
PMID26594370
show ga
X-ray free-electron lasers (XFELs) show great promise for macromolecular
structure determination from sub-micrometre-sized crystals, using the emerging
method of serial femtosecond crystallography. The extreme brightness of the XFEL
radiation can multiply ionize most, if not all, atoms in a protein, causing their
scattering factors to change during the pulse, with a preferential 'bleaching' of
heavy atoms. This paper investigates the effects of electronic damage on
experimental data collected from a Gd derivative of lysozyme microcrystals at
different X-ray intensities, and the degree of ionization of Gd atoms is
quantified from phased difference Fourier maps. A pattern sorting scheme is
proposed to maximize the ionization contrast and the way in which the local
electronic damage can be used for a new experimental phasing method is discussed.