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2016 ; 6
(ä): 33874
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Spectral Interferometry with Electron Microscopes
#MMPMID27649932
Talebi N
Sci Rep
2016[Sep]; 6
(ä): 33874
PMID27649932
show ga
Interference patterns are not only a defining characteristic of waves, but also
have several applications; characterization of coherent processes and holography.
Spatial holography with electron waves, has paved the way towards space-resolved
characterization of magnetic domains and electrostatic potentials with angstrom
spatial resolution. Another impetus in electron microscopy has been introduced by
ultrafast electron microscopy which uses pulses of sub-picosecond durations for
probing a laser induced excitation of the sample. However, attosecond temporal
resolution has not yet been reported, merely due to the statistical distribution
of arrival times of electrons at the sample, with respect to the laser time
reference. This is however, the very time resolution which will be needed for
performing time-frequency analysis. These difficulties are addressed here by
proposing a new methodology to improve the synchronization between electron and
optical excitations through introducing an efficient electron-driven photon
source. We use focused transition radiation of the electron as a pump for the
sample. Due to the nature of transition radiation, the process is coherent. This
technique allows us to perform spectral interferometry with electron microscopes,
with applications in retrieving the phase of electron-induced polarizations and
reconstructing dynamics of the induced vector potential.