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2017 ; 473
(2200
): 20160889
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Multifunctional scanning ion conductance microscopy
#MMPMID28484332
Page A
; Perry D
; Unwin PR
Proc Math Phys Eng Sci
2017[Apr]; 473
(2200
): 20160889
PMID28484332
show ga
Scanning ion conductance microscopy (SICM) is a nanopipette-based technique that
has traditionally been used to image topography or to deliver species to an
interface, particularly in a biological setting. This article highlights the
recent blossoming of SICM into a technique with a much greater diversity of
applications and capability that can be used either standalone, with advanced
control (potential-time) functions, or in tandem with other methods. SICM can be
used to elucidate functional information about interfaces, such as surface charge
density or electrochemical activity (ion fluxes). Using a multi-barrel probe
format, SICM-related techniques can be employed to deposit nanoscale
three-dimensional structures and further functionality is realized when SICM is
combined with scanning electrochemical microscopy (SECM), with simultaneous
measurements from a single probe opening up considerable prospects for
multifunctional imaging. SICM studies are greatly enhanced by finite-element
method modelling for quantitative treatment of issues such as resolution, surface
charge and (tip) geometry effects. SICM is particularly applicable to the study
of living systems, notably single cells, although applications extend to
materials characterization and to new methods of printing and nanofabrication. A
more thorough understanding of the electrochemical principles and properties of
SICM provides a foundation for significant applications of SICM in
electrochemistry and interfacial science.
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