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2017 ; 7
(1
): 1699
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Multi-pass transmission electron microscopy
#MMPMID28490730
Juffmann T
; Koppell SA
; Klopfer BB
; Ophus C
; Glaeser RM
; Kasevich MA
Sci Rep
2017[May]; 7
(1
): 1699
PMID28490730
show ga
Feynman once asked physicists to build better electron microscopes to be able to
watch biology at work. While electron microscopes can now provide atomic
resolution, electron beam induced specimen damage precludes high resolution
imaging of sensitive materials, such as single proteins or polymers. Here, we use
simulations to show that an electron microscope based on a multi-pass measurement
protocol enables imaging of single proteins, without averaging structures over
multiple images. While we demonstrate the method for particular imaging targets,
the approach is broadly applicable and is expected to improve resolution and
sensitivity for a range of electron microscopy imaging modalities, including, for
example, scanning and spectroscopic techniques. The approach implements a quantum
mechanically optimal strategy which under idealized conditions can be considered
interaction-free.